2022 BEST OF LEADERSHIP SUMMIT SPEAKER
DR. JOE FOLKMAN
SESSION: RESTORING RESILIENCE
Unsurprisingly, times of change and challenge spur a decline in the resilience of employees and leaders alike. It is when leaders are planning the future of their organizations while managing unexpected challenges, that resilience is most needed. How can we help individuals and organizations not only survive but thrive amidst these conditions?
Dr. Joe Folkman will provide insights as to why resilience is a critical behavior for leaders and share the five key actions that his research shows improve resilience. You will have the opportunity to complete a well-being self-assessment and receive a development guide to help rebuild resilience and improve as a leader.
ABOUT DR. JOE FOLKMAN
Co-founder and President, Zenger Folkman, Psychometrician, Writer, and Executive Consultant
Joe Folkman is Co-founder and President of Zenger Folkman, a firm specializing in leadership and organizational development. He is one of the nation’s renowned psychometricians (a scientist skilled in administering and interpreting objective psychological tests). His extensive expertise focuses on survey research and change management. He has over 30 years of experience, consulting with some of the world’s most prestigious and successful organizations, public and private. A distinguished expert in the field of measurement, his unique surveys and assessments are designed utilizing a database comprised of over a million assessments on over 110,000 leaders. Because these tools specifically address critical business results, facilitating development and change is the main focus of measurement efforts.
Joe has worked with clients such as AT&T, Celgene, General Motors, General Mills, Reed-Elsevier, Invesco, Wells Fargo, MUFG, and Yale University. The diversity of industries and business models has provided him with a powerful learning opportunity and an exceptional research base.
Register today for the Best of Leadership Summit – choose either the in-person or virtual event.